Product model: XD6500

Origin: UK

DAGE's X-ray tester is designed to meet the growing needs of PCB and semiconductor industries. Users can easily obtain images of the tested object in any direction with high quality, high magnification and high resolution. Due to the use of open tube technology, the magnification is far greater than that of the X-ray detector using closed tube technology, reaching submicron X, which can meet the needs of customers for higher accuracy.

The DAGE XD6500 X-RAY testing equipment is designed to provide high-end solutions for the electronic industry, and is suitable for testing various welding defects and semiconductor packaging defects in PCBA assembly process. For example, the quality of BGA, CSP, flip chip, COB, QFN, QFP and PTH plug-ins can be detected. The DAGE XL6500 can provide high-definition optical images. The rotating stage can be used for multi angle detection of products of different sizes, making the detection more comprehensive and reliable. In addition to PCBA analysis, it can also be extended to other X domains outside the PCBA industry, such as solar energy, ceramic chips, batteries, probes, etc.

UK DAGE XL6500 Tester Specifications

Size: 1450 x 1700 x 1970mm